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Speakers

Jon Giencke

Global Marketing Manager XRD & XRM

Nick Rodesney

Applications Scientist - XRD

Ben Krueger

Applications Scientist – XRD

Dave Sampson

XRM Product Specialist

Riley Snyder

Research Associate – School of Engineering, University of Edinburgh

Ralph Rowe

Senior Research Assistant, Mineralogy, Canadian Museum of Nature

Michele Gironda

Market Segment Manager Art & Conservation - BNA

Olivier Bonnerot

Research Assistant - Bundesanstalt für Materialforschung und -prüfung

Hosted by

Bruker AXS

Bruker AXS hosts virtual events and webinars to present our X-ray diffraction, X-ray microscopy, and elemental analysis solutions, including instruments, components, services, and applications.

Booths

Bruker Nano Analytics

Supporting Cultural Heritage Analysis

SKYSCAN 1273

X-Ray Microscopy

SKYSCAN 2214

Nanoscale XRM

D2 PHASER

Benchtop XRD

D8 DISCOVER

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